MPX Title
RENA-3

Key Features

  • 32 Channels
  • Ultra Low Noise
  • Two Adjustable Discriminator Outputs
  • Signal Trigger Outputs
  • Test Input
  • Extra Test Channel
  • 8 Programmable Shaping Times
  • Sparse Readout Modes
  • Channel Masking
  • Force Enable Analog Output
  • Up to 16 chips can be daisy chained

  Details

Readout Electronics for Nuclear Applications. A multi-channel charge sensitive amplifier/shaper ASIC chip for reading position sensitive solid state detectors

Applications

RENA™ can be used in applications requiring high spatial and energy resolution position sensitive detectors where no external trigger is available; from gamma-ray and x-ray astronomy, nuclear physics to medical and industrial imaging. The RENA™ chip can be used with:

  • silicon strip and pixel detectors.
  • CdZnTe strip and pixel detectors.
  • Photodiodes.
  • GaAs strip and pixel detectors.

Availability

RENA™ can be supplied as individual chips or integrated with position sensitive solid state detectors such as silicon, GaAs, CdTe, CdZnTe, diamond strip, pixel, or pad detectors. Interface electronics with data acquisition software and test and evaluation systems are also available.

Specifications

Number of channels:
32 + two test channels
Data readout modes:

Global trigger: All enabled channels read upon when any channel is triggered.
Sparse readout: Only the channels that have been triggered are read out.
Neighbor readout: Adjacent channels also readout in addition to sparse readout.
External delay trigger: Delay the disabling of non-triggered channels (see text)
Select all: Read enabled channels on an external trigger pulse 

Two discriminator levels:
Independent voltage inputs, 1.5 V to 3.5 V (Only one controls the trigger output) 
Readout data:
Channel address, overload bit and pulse height level for external ADC conversion 
Readout time:
475 ns per channel 
Daisy chain:
Up to 16 chips can be daisy chained to be readout as a single chip 
Power consumption:
~200 mW per chip 
Analog test output modes:
Enable any one channel 
Select peak-detect or follower mode 
Analog test input mode:
Input line coupled through 0.05 pF capacitor to each channel, with individual enable switches 
Shaping time:
0.4, 0.73, 1.06, 1.34, 1.73, 3.17, 4.61 or 6.05 micro-sec 
Dynamic range:
0 to 50 ke (180keV in Si, 225 keV for a CdZnTe detector) 
Input referred noise:
<150 e RMS + 8 e RMS/pF@ 550 e input charge pulse
(<1.2keV FWHM + 68 eV FWHM/pF @ 20 keV(Si)) 
(1.6 keV FWHM + 84 eV FWHM/pF @ 25keV (CdZnTe))
Chip size:
4.9 x 6.9 mm, 101 pads 

 

mages

Application of RENA™ chip with Silicon Strip detectors

 

 

Data

The following pages contain spectra obtained and applications using the RENA™ as front-end readout electronics. Please click to view.

  1. Calibration for a Hamamatsu S5972 photodiode.
  2. 241Am spectra obtained using RENA™ to read out a Hamamatsu S5972 photodiode.
  3. 139Ce spectra obtained using RENA™ to read out a Hamamatsu S5972 photodiode.
  4. 139Ce spectra obtained using RENA™ to read out a 1.75mm thick CdZnTe detector.
  5. 57Co spectra obtained using RENA™ to read out a 1.75mm thick CdZnTe detector.

 

Documents

  1. RENA™ Brochure with Specifications
  2. Complete set of RENA™ Spectra with Calibration curve.
  3. IEEE paper: "Readout Electronics for Nuclear Applications (RENA) IC"
  4. SPIE paper: "Test Results of the Readout Electronics for Nuclear Applications (RENA) Chip Developed for Position-Sensitive Solid State Detectors"




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